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Subject Keyword Abstract Author
 
 
Design and fabrication of a scanning electron microscope using a finite element analysis for electron optical system

Dong-Chul Han
The Journal of Mechanical Science and Technology, vol. 22, no. 9, pp.1734-1746, 2008

Abstract : In this paper, we describe the design and fabrication of a thermionic scanning electron microscope (SEM) and examine its characteristics analytically. In the design process, the dimensions and capacity of the SEM components, such as the electron column, lenses, and apertures, were determined using finite element analysis. All components were integrated systematically during fabrication in order to achieve the maximum performance by adjusting the lens parameters, high voltage source, and image calibration methods. As a result, a thermionic SEM image with high resolution was achieved. We discuss the primary considerations required to achieve a high-performance image.

Keyword : Scanning electron microscope; Thermal emission; Electromagnetic lens; Finite element analysis

 
 
 
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