In-Ha Sung/Hung-Gu Han/Hosung Kong
The Journal of Mechanical Science and Technology, vol. 24, no. 1, pp.107-110, 2010

Abstract : Atomic force microscopy (AFM) measurements have shown that nanoscale interfaces in sliding contact frequently exhibit atomic lattice stick-slip friction. Using various material surfaces and AFM tips, including colloidal probes, and systematically varying applied load and lever stiffness, it is demonstrated that transitions can be repeatedly observed from smooth sliding to single unit-cell slips and then multiple slips. The behavior is dependent on the interplay between the stiffness of the contact zone, the measurement system (i.e., the AFM cantilever), and the interfacial potential. Atomic lattice stick-slip occurs with colloidal particle tip orders of magnitudes larger than those previously used. Stable atomically corrugated sliding in ambient conditions that cannot be seen elsewhere is reported. The generality of these conditions suggests that atomic-scale stick-slip behavior may be far more prevalent than previously appreciated. In addition, the friction-stiffness maps of various material surfaces in contact with a colloidal particle were reported, and the complex effects of system stiffness and pressure were discussed for chemical-mechanical polishing applications.

Keyword : Atomic force microscopy; Atomic-scale stick-slip friction; Chemical-mechanical polishing (CMP); Contact stiffness