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Optimization of rapid thermal processing for uniform temperature distribution on wafer surface Hyuck-Keun Oh
The Journal of Mechanical Science and Technology, vol. 23, no. 6, pp.1544-1552, 2009
Abstract : An optimization of rapid thermal processing (RTP) was conducted to obtain uniform temperature distribution on a
wafer surface by using linear programming and radiative heat transfer modeling. The results show that two heating
lamp zones are needed to maintain uniform wafer temperature and the optimal lamp positions are unique for a given
geometry and not affected by wafer temperatures. The radii of heating lamps, which were obtained by optimization, are
45 mm and 108 mm. The emissivity and temperature of the chamber wall do not significantly affect the optimal condition.
With obtained optimum geometry of the RTP chamber and lamp positions, the wafer surface temperatures were
calculated. The uniformity allowance of the wafer surface is less than ¡¾1¡É when the mean temperature of the wafer
surface is 1000¡É.
Keyword :
Linear programming; Optimization; Rapid thermal processing; Uniform wafer temperature
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